Terahertz Technology and Its Applications

Peña, Victor Pacheco

Terahertz Technology and Its Applications - Basel, Switzerland MDPI - Multidisciplinary Digital Publishing Institute 2021 - 1 electronic resource (162 p.)

Open Access

The Terahertz frequency range (0.1 – 10)THz has demonstrated to provide many opportunities in prominent research fields such as high-speed communications, biomedicine, sensing, and imaging. This spectral range, lying between electronics and photonics, has been historically known as “terahertz gap” because of the lack of experimental as well as fabrication technologies. However, many efforts are now being carried out worldwide in order improve technology working at this frequency range. This book represents a mechanism to highlight some of the work being done within this range of the electromagnetic spectrum. The topics covered include non-destructive testing, teraherz imaging and sensing, among others.


Creative Commons


English

books978-3-0365-0997-6 9783036509969 9783036509976

10.3390/books978-3-0365-0997-6 doi


Research & information: general

W band Schottky Diode Detectors ZBD modeling wire bonding flip-chip Terahertz radar radar cross-section signal-to-noise ratio adaptive range gates cascaded doubler quadrupler Schottky varactor hybrid integrated circuit terahertz spectroscopy optical delay line correction optical encoder terahertz spectra terahertz metrology bias sub-harmonic mixer anti-series Schottky diode conversion loss terahertz wave generation InGaAs molecular beam epitaxy time-domain spectroscopy photoconductive antenna open stone relics hollowing weathered preservation of cultural heritage THz-TDS rubber vulcanization silica dispersion terahertz imaging light field imaging synthetic aperture imaging image distortion resolving power THz detector rectangular inset-feed patch antenna catadioptric horn-like lens CMOS process resonances periodic waveguides reflection phases topological properties oscillator THz high output power CMOS terahertz waves honeycomb sandwiches foreign materials time-of-flight electric field n/a