Nanoscale Self-Assembly: Nanopatterning and Metrology (Record no. 48236)

MARC details
000 -LEADER
fixed length control field 04532naaaa2200829uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/77002
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220219223309.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number books978-3-0365-1960-9
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783036519616
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783036519609
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.3390/books978-3-0365-1960-9
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
072 #7 - SUBJECT CATEGORY CODE
Subject category code TB
Source bicssc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Ferrarese Lupi, Federico
Relationship edt
245 10 - TITLE STATEMENT
Title Nanoscale Self-Assembly: Nanopatterning and Metrology
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Basel, Switzerland
Name of publisher, distributor, etc. MDPI - Multidisciplinary Digital Publishing Institute
Date of publication, distribution, etc. 2021
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (124 p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc. The self-assembly process underlies a plethora of natural phenomena from the macro to the nano scale. Often, technological development has found great inspiration in the natural world, as evidenced by numerous fabrication techniques based on self-assembly (SA). One striking example is given by epitaxial growths, in which atoms represent the building blocks. In lithography, the use of self-assembling materials is considered an extremely promising patterning option to overcome the size scale limitations imposed by the conventional photolithographic methods. To this purpose, in the last two decades several supramolecular self-assembling materials have been investigated and successfully applied to create patterns at a nanometric scale. Although considerable progress has been made so far in the control of self-assembly processes applied to nanolithography, a number of unresolved problems related to the reproducibility and metrology of the self-assembled features are still open. Addressing these issues is mandatory in order to allow the widespread diffusion of SA materials for applications such as microelectronics, photonics, or biology. In this context, the aim of the present Special Issue is to gather original research papers and comprehensive reviews covering various aspects of the self-assembly processes applied to nanopatterning. Topics include the development of novel SA methods, the realization of nanometric structures and devices, and the improvement of their long-range order. Moreover, metrology issues related to the nanoscale characterization of self-assembled structures are addressed.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction Creative Commons
Use and reproduction rights https://creativecommons.org/licenses/by/4.0/
Source of term cc
-- https://creativecommons.org/licenses/by/4.0/
546 ## - LANGUAGE NOTE
Language note English
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Technology: general issues
Source of heading or term bicssc
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Uncontrolled term block copolymer self-assembly
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Uncontrolled term nanospheres lithography
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Uncontrolled term direct laser-writing
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Uncontrolled term directed self-assembly (DSA)
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Uncontrolled term classification of nanoparticles
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Uncontrolled term analytical centrifugation
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700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ferrarese Lupi, Federico
Relationship oth
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://mdpi.com/books/pdfview/book/4612">https://mdpi.com/books/pdfview/book/4612</a>
Access status 0
Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/77002">https://directory.doabooks.org/handle/20.500.12854/77002</a>
Access status 0
Public note DOAB: description of the publication

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