Ellipsometry - Principles and Techniques for Materials Characterization (Record no. 64363)

MARC details
000 -LEADER
fixed length control field 01840naaaa2200313uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/46217
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220220041145.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 65558
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789535136248
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789535136231
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.5772/65558
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Faustino Wahaia
Relationship auth
245 10 - TITLE STATEMENT
Title Ellipsometry - Principles and Techniques for Materials Characterization
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. IntechOpen
Date of publication, distribution, etc. 2017
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (162 p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc. Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction All rights reserved
-- http://oapen.org/content/about-rights
546 ## - LANGUAGE NOTE
Language note English
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Physical Sciences
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Engineering and Technology
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Optoelectronics
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Physics
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Optics and Lasers
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://www.intechopen.com/books/ellipsometry-principles-and-techniques-for-materials-characterization">https://www.intechopen.com/books/ellipsometry-principles-and-techniques-for-materials-characterization</a>
Access status 0
Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/46217">https://directory.doabooks.org/handle/20.500.12854/46217</a>
Access status 0
Public note DOAB: description of the publication

No items available.