Atomic-force Microscopy and Its Applications (Record no. 74807)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01979naaaa2200337uu 4500 |
| 001 - CONTROL NUMBER | |
| control field | https://directory.doabooks.org/handle/20.500.12854/41515 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20220220080244.0 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | intechopen.74139 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781789851700 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781789851694 |
| 024 7# - OTHER STANDARD IDENTIFIER | |
| Standard number or code | 10.5772/intechopen.74139 |
| Terms of availability | doi |
| 041 0# - LANGUAGE CODE | |
| Language code of text/sound track or separate title | English |
| 042 ## - AUTHENTICATION CODE | |
| Authentication code | dc |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Tomasz Tański |
| Relationship | auth |
| 245 10 - TITLE STATEMENT | |
| Title | Atomic-force Microscopy and Its Applications |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | IntechOpen |
| Date of publication, distribution, etc. | 2019 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 electronic resource (114 p.) |
| 506 0# - RESTRICTIONS ON ACCESS NOTE | |
| Terms governing access | Open Access |
| Source of term | star |
| Standardized terminology for access restriction | Unrestricted online access |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc. | Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution. This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy. The chapters for this book have been written by respected and well-known researchers and specialists from different countries. We hope that after studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation. |
| 540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE | |
| Terms governing use and reproduction | All rights reserved |
| -- | http://oapen.org/content/about-rights |
| 546 ## - LANGUAGE NOTE | |
| Language note | English |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Physical Sciences |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Engineering and Technology |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Chemistry |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Analytical Chemistry |
| 653 ## - INDEX TERM--UNCONTROLLED | |
| Uncontrolled term | Instrumental Chemistry |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Bogusław Ziębowicz |
| Relationship | auth |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Marcin Staszuk |
| Relationship | auth |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Host name | www.oapen.org |
| Uniform Resource Identifier | <a href="https://www.intechopen.com/books/atomic-force-microscopy-and-its-applications">https://www.intechopen.com/books/atomic-force-microscopy-and-its-applications</a> |
| Access status | 0 |
| Public note | DOAB: download the publication |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Host name | www.oapen.org |
| Uniform Resource Identifier | <a href="https://directory.doabooks.org/handle/20.500.12854/41515">https://directory.doabooks.org/handle/20.500.12854/41515</a> |
| Access status | 0 |
| Public note | DOAB: description of the publication |
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