Scanning Probe Microscopy : Physical Property Characterization at Nanoscale (Record no. 74895)

MARC details
000 -LEADER
fixed length control field 02068naaaa2200301uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/66051
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220220080444.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 2653
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789535105763
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789535149989
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.5772/2653
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
072 #7 - SUBJECT CATEGORY CODE
Subject category code PNFS
Source bicssc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Nalladega, Vijay
Relationship edt
245 10 - TITLE STATEMENT
Title Scanning Probe Microscopy : Physical Property Characterization at Nanoscale
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. IntechOpen
Date of publication, distribution, etc. 2012
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (256 p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc. Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction Creative Commons
Use and reproduction rights https://creativecommons.org/licenses/by/3.0/
Source of term cc
-- https://creativecommons.org/licenses/by/3.0/
546 ## - LANGUAGE NOTE
Language note English
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Spectrum analysis, spectrochemistry, mass spectrometry
Source of heading or term bicssc
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Electrochemistry & magnetochemistry
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Nalladega, Vijay
Relationship oth
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://mts.intechopen.com/storage/books/2264/authors_book/authors_book.pdf">https://mts.intechopen.com/storage/books/2264/authors_book/authors_book.pdf</a>
Access status 0
Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/66051">https://directory.doabooks.org/handle/20.500.12854/66051</a>
Access status 0
Public note DOAB: description of the publication

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