Scanning Electron Microscopy (Record no. 75660)

MARC details
000 -LEADER
fixed length control field 02070naaaa2200301uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/58917
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220220082115.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1973
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789535100928
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.5772/1973
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Viacheslav Kazmiruk
Relationship auth
245 10 - TITLE STATEMENT
Title Scanning Electron Microscopy
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. IntechOpen
Date of publication, distribution, etc. 2012
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (844 p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc. Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging but quantitative measurement of object topologies, local electrophysical characteristics of semiconductor structures and performing elemental analysis. Moreover, a fine focused e-beam is widely used for the creation of micro and nanostructures. The book's approach covers both theoretical and practical issues related to scanning electron microscopy. The book has 41 chapters, divided into six sections: Instrumentation, Methodology, Biology, Medicine, Material Science, Nanostructured Materials for Electronic Industry, Thin Films, Membranes, Ceramic, Geoscience, and Mineralogy. Each chapter, written by different authors, is a complete work which presupposes that readers have some background knowledge on the subject.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction All rights reserved
-- http://oapen.org/content/about-rights
546 ## - LANGUAGE NOTE
Language note English
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Physical Sciences
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Engineering and Technology
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Optoelectronics
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Physics
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Optics and Lasers
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://www.intechopen.com/books/scanning-electron-microscopy">https://www.intechopen.com/books/scanning-electron-microscopy</a>
Access status 0
Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/58917">https://directory.doabooks.org/handle/20.500.12854/58917</a>
Access status 0
Public note DOAB: description of the publication

No items available.