TY  - GEN
AU  - Faustino Wahaia
TI  - Ellipsometry - Principles and Techniques for Materials Characterization
SN  - 65558
PY  - 2017///
PB  - IntechOpen
KW  - Physical Sciences
KW  - Engineering and Technology
KW  - Optoelectronics
KW  - Physics
KW  - Optics and Lasers
N1  - Open Access
N2  - Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization
UR  - https://www.intechopen.com/books/ellipsometry-principles-and-techniques-for-materials-characterization
UR  - https://directory.doabooks.org/handle/20.500.12854/46217
ER  -