Müller, Daniel <br/><br/>
RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range 

 -  KIT Scientific Publishing  2018 
 - 1 electronic resource (XII, 180 p. p.) 
<br/><br/> Open Access 
<br/><br/> Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions. 
<br/><br/><br/>Creative Commons 
<br/><br/><br/>English 
<br/><br/><label>ISBN: </label>KSP/1000084392 9783731508229 
<br/><br/><label>Standard No.: </label>10.5445/KSP/1000084392  doi 
<br/><br/><label>Subjects--Index Terms: </label>On-Wafer Measurements Monolithic Microwave Integrated Circuits Halbleiterschaltungen Messtechnik Hochfrequenztechnik Electromagnetic Field Simulation Elektromagnetische Feldsimulation Radio Frequency