TY  - GEN
AU  - Müller,Daniel
TI  - RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
SN  - KSP/1000084392
PY  - 2018///
PB  - KIT Scientific Publishing
KW  - On-Wafer Measurements
KW  - Monolithic Microwave Integrated Circuits
KW  - Halbleiterschaltungen
KW  - Messtechnik
KW  - Hochfrequenztechnik
KW  - Electromagnetic Field Simulation
KW  - Elektromagnetische Feldsimulation
KW  - Radio Frequency
N1  - Open Access
N2  - Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions
UR  - https://www.ksp.kit.edu/9783731508229
UR  - https://directory.doabooks.org/handle/20.500.12854/58448
ER  -