TY - GEN AU - Li,Qiliang AU - Zhu,Hao TI - Nanoelectronic Materials, Devices and Modeling SN - books978-3-03921-226-2 PY - 2019/// PB - MDPI - Multidisciplinary Digital Publishing Institute KW - quantum mechanical KW - n/a KW - neuromorphic computation KW - off-current (Ioff) KW - double-gate tunnel field-effect-transistor KW - topological insulator KW - back current blocking layer (BCBL) KW - CMOS power amplifier IC KW - information integration KW - distributed Bragg KW - spike-timing-dependent plasticity KW - electron affinity KW - enhancement-mode KW - current collapse KW - gallium nitride (GaN) KW - band-to-band tunneling KW - vertical field-effect transistor (VFET) KW - ionic liquid KW - luminescent centres KW - thermal coupling KW - vision localization KW - PC1D KW - UAV KW - ZnO/Si KW - dual-switching transistor KW - memristor KW - field-effect transistor KW - higher order synchronization KW - shallow trench isolation (STI) KW - memristive device KW - on-current (Ion) KW - low voltage KW - reflection transmision method KW - dielectric layer KW - source/drain (S/D) KW - high efficiency KW - nanostructure synthesis KW - InAlN/GaN heterostructure KW - supercapacitor KW - high-electron mobility transistor (HEMTs) KW - heterojunction KW - p-GaN KW - recessed channel array transistor (RCAT) KW - gate field effect KW - charge injection KW - saddle FinFET (S-FinFET) KW - L-shaped tunnel field-effect-transistor KW - conductivity KW - energy storage KW - hierarchical KW - PECVD KW - sample grating KW - MISHEMT KW - bistability KW - threshold voltage (VTH) KW - bandgap tuning KW - oscillatory neural networks KW - UV irradiation KW - Mott transition KW - third harmonic tuning KW - topological magnetoelectric effect KW - cross-gain modulation KW - 2D material KW - solar cells KW - silicon on insulator (SOI) KW - Green’s function KW - optoelectronic devices KW - semiconductor optical amplifier KW - ZnO films KW - graphene KW - AlGaN/GaN KW - polarization effect KW - two-photon process KW - conductive atomic force microscopy (cAFM) KW - 2DEG density KW - vanadium dioxide KW - interface traps KW - potential drop width (PDW) KW - pattern recognition KW - drain-induced barrier lowering (DIBL) KW - atomic layer deposition (ALD) KW - normally off power devices KW - gate-induced drain leakage (GIDL) KW - insulator–metal transition (IMT) KW - zinc oxide KW - synaptic device KW - subthreshold slope (SS) KW - landing KW - silicon KW - corner-effect KW - conditioned reflex KW - quantum dot KW - gallium nitride KW - bismuth ions KW - conduction band offset KW - variational form N1 - Open Access N2 - As CMOS scaling is approaching the fundamental physical limits, a wide range of new nanoelectronic materials and devices have been proposed and explored to extend and/or replace the current electronic devices and circuits so as to maintain progress with respect to speed and integration density. The major limitations, including low carrier mobility, degraded subthreshold slope, and heat dissipation, have become more challenging to address as the size of silicon-based metal oxide semiconductor field effect transistors (MOSFETs) has decreased to nanometers, while device integration density has increased. This book aims to present technical approaches that address the need for new nanoelectronic materials and devices. The focus is on new concepts and knowledge in nanoscience and nanotechnology for applications in logic, memory, sensors, photonics, and renewable energy. This research on nanoelectronic materials and devices will be instructive in finding solutions to address the challenges of current electronics in switching speed, power consumption, and heat dissipation and will be of great interest to academic society and the industry UR - https://mdpi.com/books/pdfview/book/1423 UR - https://directory.doabooks.org/handle/20.500.12854/54256 ER -