000 01735naaaa2200349uu 4500
001 https://directory.doabooks.org/handle/20.500.12854/62856
005 20220219213239.0
020 _aKSP/1000070029
020 _a9783731506799
024 7 _a10.5445/KSP/1000070029
_cdoi
041 0 _aEnglish
042 _adc
100 1 _aKoch, Frieder Johannes
_4auth
245 1 0 _aX-ray optics made by X-ray lithography: Process optimization and quality control
260 _bKIT Scientific Publishing
_c2017
300 _a1 electronic resource (X, 138 p. p.)
506 0 _aOpen Access
_2star
_fUnrestricted online access
520 _aGrating based X-ray phase contrast imaging sets out to overcome the limits of conventional X-ray imaging in the detection of subtle density differences and opens a way to characterize a sample’s microstructure without the need for ultrahigh spatial resolution. The technique relies on grating structures with micrometric periods and extreme aspect ratio – their fabrication by X-ray lithography with optimal structure quality is the topic of this work.
540 _aCreative Commons
_fhttps://creativecommons.org/licenses/by-sa/4.0/
_2cc
_4https://creativecommons.org/licenses/by-sa/4.0/
546 _aEnglish
653 _aTalbot effect
653 _aRöntgengitter
653 _aLIGA
653 _aX-ray optics
653 _aPhasenkontrast
653 _aTalbot-Effect
653 _aphase contrast
653 _aX-ray gratings
653 _aRöntgenoptik
856 4 0 _awww.oapen.org
_uhttps://www.ksp.kit.edu/9783731506799
_70
_zDOAB: download the publication
856 4 0 _awww.oapen.org
_uhttps://directory.doabooks.org/handle/20.500.12854/62856
_70
_zDOAB: description of the publication
999 _c45126
_d45126