| 000 | 04442naaaa2201141uu 4500 | ||
|---|---|---|---|
| 001 | https://directory.doabooks.org/handle/20.500.12854/77160 | ||
| 005 | 20220219224629.0 | ||
| 020 | _abooks978-3-0365-2678-2 | ||
| 020 | _a9783036526799 | ||
| 020 | _a9783036526782 | ||
| 024 | 7 |
_a10.3390/books978-3-0365-2678-2 _cdoi |
|
| 041 | 0 | _aEnglish | |
| 042 | _adc | ||
| 072 | 7 |
_aTB _2bicssc |
|
| 100 | 1 |
_aBoczar, Tomasz _4edt |
|
| 700 | 1 |
_aKunicki, Michał _4edt |
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| 700 | 1 |
_aWotzka, Daria _4edt |
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| 700 | 1 |
_aNagi, Łukasz _4edt |
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| 700 | 1 |
_aKozioł, Michał _4edt |
|
| 700 | 1 |
_aBoczar, Tomasz _4oth |
|
| 700 | 1 |
_aKunicki, Michał _4oth |
|
| 700 | 1 |
_aWotzka, Daria _4oth |
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| 700 | 1 |
_aNagi, Łukasz _4oth |
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| 700 | 1 |
_aKozioł, Michał _4oth |
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| 245 | 1 | 0 | _aAdvances in Sensors and Sensing for Technical Condition Assessment and NDT |
| 260 |
_aBasel, Switzerland _bMDPI - Multidisciplinary Digital Publishing Institute _c2021 |
||
| 300 | _a1 electronic resource (216 p.) | ||
| 506 | 0 |
_aOpen Access _2star _fUnrestricted online access |
|
| 520 | _aThe adequate assessment of key apparatus conditions is a hot topic in all branches of industry. Various online and offline diagnostic methods are widely applied to provide early detections of any abnormality in exploitation. Furthermore, different sensors may also be applied to capture selected physical quantities that may be used to indicate the type of potential fault. The essential steps of the signal analysis regarding the technical condition assessment process may be listed as: signal measurement (using relevant sensors), processing, modelling, and classification. In the Special Issue entitled “Advances in Sensors and Sensing for Technical Condition Assessment and NDT”, we present the latest research in various areas of technology. | ||
| 540 |
_aCreative Commons _fhttps://creativecommons.org/licenses/by/4.0/ _2cc _4https://creativecommons.org/licenses/by/4.0/ |
||
| 546 | _aEnglish | ||
| 650 | 7 |
_aTechnology: general issues _2bicssc |
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| 653 | _apulse compression | ||
| 653 | _ascattering | ||
| 653 | _aattenuation | ||
| 653 | _ainsulation | ||
| 653 | _aultrasonic testing | ||
| 653 | _aOLTC | ||
| 653 | _aAE sensor | ||
| 653 | _aacoustic emission | ||
| 653 | _afeature extraction | ||
| 653 | _asupervised classification | ||
| 653 | _amachine learning | ||
| 653 | _acontrast-enhanced ultrasound | ||
| 653 | _amuscle perfusion | ||
| 653 | _aNakagami parameter | ||
| 653 | _acompounding Nakagami imaging | ||
| 653 | _alow-frequency sensor | ||
| 653 | _apower transformer | ||
| 653 | _alow-frequency noise | ||
| 653 | _agenetic algorithm | ||
| 653 | _ageometric layout of railway track | ||
| 653 | _atrack axis identification | ||
| 653 | _atramway loop | ||
| 653 | _aroute’s polygon | ||
| 653 | _aGNSS mobile measurements | ||
| 653 | _avibroarthography | ||
| 653 | _aVAG | ||
| 653 | _aknee joint | ||
| 653 | _aspectral features | ||
| 653 | _afrequency analysis | ||
| 653 | _anon-invasive examination | ||
| 653 | _alateral temperature gradient | ||
| 653 | _atemperature field | ||
| 653 | _aboundary conditions | ||
| 653 | _asolar radiation intensity | ||
| 653 | _atemperature monitoring | ||
| 653 | _anon-destructive evaluation | ||
| 653 | _aeddy current | ||
| 653 | _a3D sensing | ||
| 653 | _ainverse problem | ||
| 653 | _awavelet transform | ||
| 653 | _aprincipal component analysis | ||
| 653 | _aneural network | ||
| 653 | _aincubation | ||
| 653 | _aspectrum | ||
| 653 | _aimage processing | ||
| 653 | _aROC curve | ||
| 653 | _ainfrasound measurement system | ||
| 653 | _awind turbine | ||
| 653 | _ainfrasound correlation analysis | ||
| 653 | _ameasuring scale | ||
| 653 | _athermoelastic deformation | ||
| 653 | _acoefficient of thermal expansion | ||
| 653 | _aelastic waves | ||
| 653 | _alaser ultrasound | ||
| 653 | _aFizeau fiber interferometer | ||
| 653 | _adefect identification | ||
| 653 | _ahigh-current pulses | ||
| 653 | _acurrent measurement | ||
| 653 | _ahigh-current shunts | ||
| 653 | _acircuit modeling | ||
| 653 | _aRogowski coil | ||
| 653 | _aelectrodynamic accelerators | ||
| 653 | _an/a | ||
| 856 | 4 | 0 |
_awww.oapen.org _uhttps://mdpi.com/books/pdfview/book/4778 _70 _zDOAB: download the publication |
| 856 | 4 | 0 |
_awww.oapen.org _uhttps://directory.doabooks.org/handle/20.500.12854/77160 _70 _zDOAB: description of the publication |
| 999 |
_c48885 _d48885 |
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