| 000 | 01840naaaa2200313uu 4500 | ||
|---|---|---|---|
| 001 | https://directory.doabooks.org/handle/20.500.12854/46217 | ||
| 005 | 20220220041145.0 | ||
| 020 | _a65558 | ||
| 020 | _a9789535136248 | ||
| 020 | _a9789535136231 | ||
| 024 | 7 |
_a10.5772/65558 _cdoi |
|
| 041 | 0 | _aEnglish | |
| 042 | _adc | ||
| 100 | 1 |
_aFaustino Wahaia _4auth |
|
| 245 | 1 | 0 | _aEllipsometry - Principles and Techniques for Materials Characterization |
| 260 |
_bIntechOpen _c2017 |
||
| 300 | _a1 electronic resource (162 p.) | ||
| 506 | 0 |
_aOpen Access _2star _fUnrestricted online access |
|
| 520 | _aEllipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization. | ||
| 540 |
_aAll rights reserved _4http://oapen.org/content/about-rights |
||
| 546 | _aEnglish | ||
| 653 | _aPhysical Sciences | ||
| 653 | _aEngineering and Technology | ||
| 653 | _aOptoelectronics | ||
| 653 | _aPhysics | ||
| 653 | _aOptics and Lasers | ||
| 856 | 4 | 0 |
_awww.oapen.org _uhttps://www.intechopen.com/books/ellipsometry-principles-and-techniques-for-materials-characterization _70 _zDOAB: download the publication |
| 856 | 4 | 0 |
_awww.oapen.org _uhttps://directory.doabooks.org/handle/20.500.12854/46217 _70 _zDOAB: description of the publication |
| 999 |
_c64363 _d64363 |
||