000			01890naaaa2200385uu 4500
001			https://directory.doabooks.org/handle/20.500.12854/56139
005			20220220043058.0
020			_abooks978-3-03897-285-3
020			_a9783038972846
020			_a9783038972853
024	7		_a10.3390/books978-3-03897-285-3 _cdoi
041	0		_aEnglish
042			_adc
100	1		_aSimon Zabler (Ed.) _4auth
245	1	0	_aPhase-Contrast and Dark-Field Imaging
260			_bMDPI - Multidisciplinary Digital Publishing Institute _c2019
300			_a1 electronic resource (146 p.)
506	0		_aOpen Access _2star _fUnrestricted online access
520			_aThe intent of this Special Issue is to provide a framework with which scientists in several different disciplines, related to phase-contrast and dark-field imaging, can illustrate their ideas and results. The articles are reviews or very recent scientific reports; they address newcomers in the field, as well as experts and professors in fields of X-ray physics, electron, and phase-contrast X-ray imaging.
540			_aCreative Commons _fhttps://creativecommons.org/licenses/by-nc-nd/4.0/ _2cc _4https://creativecommons.org/licenses/by-nc-nd/4.0/
546			_aEnglish
653			_aX-ray scattering
653			_aCoded-aperture imaging
653			_aTalbot-Interferometer
653			_aMoiré pattern analysis
653			_aElectron Backscatter imaging
653			_aDark-field imaging
653			_aComputed Tomography
653			_acultural heritage
653			_aX-ray Phase-contrast imaging
653			_amedical imaging
653			_aimage processing: Fourier image analysis
856	4	0	_awww.oapen.org _uhttps://www.mdpi.com/books/pdfview/book/1078 _70 _zDOAB: download the publication
856	4	0	_awww.oapen.org _uhttps://directory.doabooks.org/handle/20.500.12854/56139 _70 _zDOAB: description of the publication
999			_c65209 _d65209