000 02283naaaa2200337uu 4500
001 https://directory.doabooks.org/handle/20.500.12854/67616
005 20220220093047.0
020 _aintechopen.83201
020 _a9781838801908
020 _a9781838801892
020 _a9781839682841
024 7 _a10.5772/intechopen.83201
_cdoi
041 0 _aEnglish
042 _adc
072 7 _aPNFS
_2bicssc
100 1 _aSingh, Devinder
_4edt
700 1 _aCondurache-Bota, Simona
_4edt
700 1 _aSingh, Devinder
_4oth
700 1 _aCondurache-Bota, Simona
_4oth
245 1 0 _aElectron Crystallography
260 _bIntechOpen
_c2020
300 _a1 electronic resource (114 p.)
506 0 _aOpen Access
_2star
_fUnrestricted online access
520 _aIn the quantitative determination of new structures, micro-/nano-crystalline materials pose significant challenges. The different properties of materials are structure-dependent. Traditionally, X-ray crystallography has been used for the analysis of these materials. Electron diffraction is a technique that complements other techniques; for example, single crystal X-ray diffraction and powder X-ray diffraction for determination of structure. Electron diffraction plays a very important role when crystals are very small using single crystal X-ray diffraction or very complex for structure solution by powder X-ray diffraction. With the introduction of advanced methodologies, important methods for crystal structural analysis in the field of electron crystallography have been discovered, such as rotation electron diffraction (RED) and automated electron diffraction tomography (ADT). In recent years, large numbers of crystal structures have been solved using electron crystallography.
540 _aCreative Commons
_fhttps://creativecommons.org/licenses/by/3.0/
_2cc
_4https://creativecommons.org/licenses/by/3.0/
546 _aEnglish
650 7 _aSpectrum analysis, spectrochemistry, mass spectrometry
_2bicssc
653 _aCrystallography
856 4 0 _awww.oapen.org
_uhttps://mts.intechopen.com/storage/books/9205/authors_book/authors_book.pdf
_70
_zDOAB: download the publication
856 4 0 _awww.oapen.org
_uhttps://directory.doabooks.org/handle/20.500.12854/67616
_70
_zDOAB: description of the publication
999 _c78768
_d78768