RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range (Record no. 67076)

MARC details
000 -LEADER
fixed length control field 01824naaaa2200337uu 4500
001 - CONTROL NUMBER
control field https://directory.doabooks.org/handle/20.500.12854/58448
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220220051038.0
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number KSP/1000084392
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783731508229
024 7# - OTHER STANDARD IDENTIFIER
Standard number or code 10.5445/KSP/1000084392
Terms of availability doi
041 0# - LANGUAGE CODE
Language code of text/sound track or separate title English
042 ## - AUTHENTICATION CODE
Authentication code dc
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Müller, Daniel
Relationship auth
245 10 - TITLE STATEMENT
Title RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. KIT Scientific Publishing
Date of publication, distribution, etc. 2018
300 ## - PHYSICAL DESCRIPTION
Extent 1 electronic resource (XII, 180 p. p.)
506 0# - RESTRICTIONS ON ACCESS NOTE
Terms governing access Open Access
Source of term star
Standardized terminology for access restriction Unrestricted online access
520 ## - SUMMARY, ETC.
Summary, etc. Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.
540 ## - TERMS GOVERNING USE AND REPRODUCTION NOTE
Terms governing use and reproduction Creative Commons
Use and reproduction rights https://creativecommons.org/licenses/by-sa/4.0/
Source of term cc
-- https://creativecommons.org/licenses/by-sa/4.0/
546 ## - LANGUAGE NOTE
Language note English
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term On-Wafer Measurements
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Monolithic Microwave Integrated Circuits
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Halbleiterschaltungen
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Messtechnik
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Hochfrequenztechnik
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Electromagnetic Field Simulation
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Elektromagnetische Feldsimulation
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Radio Frequency
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://www.ksp.kit.edu/9783731508229">https://www.ksp.kit.edu/9783731508229</a>
Access status 0
Public note DOAB: download the publication
856 40 - ELECTRONIC LOCATION AND ACCESS
Host name www.oapen.org
Uniform Resource Identifier <a href="https://directory.doabooks.org/handle/20.500.12854/58448">https://directory.doabooks.org/handle/20.500.12854/58448</a>
Access status 0
Public note DOAB: description of the publication

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