RF Probe-Induced On-Wafer Measurement Errors in the Millimeter-Wave Frequency Range

By: Material type: ArticleArticleLanguage: English Publication details: KIT Scientific Publishing 2018Description: 1 electronic resource (XII, 180 p. p.)ISBN:
  • KSP/1000084392
  • 9783731508229
Subject(s): Online resources: Summary: Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.
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Measurement at millimeter-wave frequencies are prone to parasitic effects which distort the overall results. Especially the use of RF probes introduces unknown distortions, even after the measurement setup is calibrated. This works investigates these distortions based on electromagnetic field simulations of integrated circuits in conjunction with models of the used RF probes. This allows to comprehend the observed distortions and successfully resolve the root of the distortions.

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